Using VaR and CVaR techniques to calculate the long-term operational reserve

Leonardo Bremermann, Mauro Rosa, Pablo Galvis, Caio Nakasone, Leonel Carvalho, Fernando Santos

Resultado de pesquisarevisão de pares

3 Citações (Scopus)

Resumo

Generally, the more Renewable Energy Sources (RES) in generation mix the more complex is the problem of reliability assessment of generating systems, mainly because of the variability and uncertainty of generating capacity. These short-term concerns have been seen as a way of controlling the amount of spinning reserve, providing operators with information on operation system risks. For the medium and long-term assessment, such short-term concerns should be accounted for the system performance [1,2], assuring that investment options will result in more robust and flexible generating configurations that are consequently more secure. In order to deal with the spinning reserve needs, this work proposes the use of a risk based technique, Value-at-Risk and Conditional Value-at-Risk, to assist the planners of the Electric Power Systems (EPS) as regards the design of the flexibility of generating systems. This methodology was applied in the IEEE-RTS-96 HW producing adequate results.

Idioma originalInglês
Título da publicação do anfitrião2016 International Conference on Probabilistic Methods Applied to Power Systems, PMAPS 2016 - Proceedings
EditoraInstitute of Electrical and Electronics Engineers Inc.
ISBN (eletrónico)9781509019700
DOIs
Estado da publicaçãoPublicadas - 1 dez. 2016
Publicado externamenteSim
Evento2016 International Conference on Probabilistic Methods Applied to Power Systems, PMAPS 2016 - Beijing
Duração: 16 out. 201620 out. 2016

Série de publicação

Nome2016 International Conference on Probabilistic Methods Applied to Power Systems, PMAPS 2016 - Proceedings

Conferência

Conferência2016 International Conference on Probabilistic Methods Applied to Power Systems, PMAPS 2016
País/TerritórioChina
CidadeBeijing
Período16/10/1620/10/16

Nota bibliográfica

Publisher Copyright:
© 2016 IEEE.

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